WO2012120192A3 - Machine vision system for quality control - Google Patents

Machine vision system for quality control Download PDF

Info

Publication number
WO2012120192A3
WO2012120192A3 PCT/FI2012/050213 FI2012050213W WO2012120192A3 WO 2012120192 A3 WO2012120192 A3 WO 2012120192A3 FI 2012050213 W FI2012050213 W FI 2012050213W WO 2012120192 A3 WO2012120192 A3 WO 2012120192A3
Authority
WO
WIPO (PCT)
Prior art keywords
quality control
vision system
machine vision
different images
seam
Prior art date
Application number
PCT/FI2012/050213
Other languages
French (fr)
Other versions
WO2012120192A2 (en
Inventor
Kosti Kannas
Original Assignee
Oy Mapvision Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oy Mapvision Ltd filed Critical Oy Mapvision Ltd
Priority to EP12754525.9A priority Critical patent/EP2684033A4/en
Publication of WO2012120192A2 publication Critical patent/WO2012120192A2/en
Publication of WO2012120192A3 publication Critical patent/WO2012120192A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A system and a method for inspecting quality of a portion of a manufactured object. The system is configured to acquire a plurality of different images from a seam (11) which forms a portion of an object (10a, 10b) to be inspected. The plurality of different images may be acquired by using a plurality of cameras (C) or plurality of different lighting conditions or a combination thereof. From the plurality of different images it is possible to compute a value representing the quality of the seam.
PCT/FI2012/050213 2011-03-10 2012-03-05 Machine vision system for quality control WO2012120192A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP12754525.9A EP2684033A4 (en) 2011-03-10 2012-03-05 Machine vision system for quality control

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20115241A FI20115241A0 (en) 2011-03-10 2011-03-10 Machine vision system for quality control
FI20115241 2011-03-10

Publications (2)

Publication Number Publication Date
WO2012120192A2 WO2012120192A2 (en) 2012-09-13
WO2012120192A3 true WO2012120192A3 (en) 2012-11-08

Family

ID=43806452

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FI2012/050213 WO2012120192A2 (en) 2011-03-10 2012-03-05 Machine vision system for quality control

Country Status (3)

Country Link
EP (1) EP2684033A4 (en)
FI (1) FI20115241A0 (en)
WO (1) WO2012120192A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3040782B1 (en) * 2015-09-08 2017-09-01 Eurostat Group DEVICE AND METHOD FOR CONTROLLING A THERMOFORMED PART

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4863268A (en) * 1984-02-14 1989-09-05 Diffracto Ltd. Diffractosight improvements
US5978090A (en) * 1996-10-10 1999-11-02 Elpatronic Ag Method and arrangement for optical inspection of a weld seam
US6204469B1 (en) * 1999-03-04 2001-03-20 Honda Giken Kogyo Kabushiki Kaisha Laser welding system
WO2001096839A1 (en) * 2000-06-14 2001-12-20 Teradyne, Inc. Optical inspection system
WO2006048500A1 (en) * 2004-11-03 2006-05-11 Valtion Teknillinen Tutkimuskeskus Laser welding method
US20090281753A1 (en) * 2008-03-31 2009-11-12 Noam Noy method and system for photovoltaic cell production yield enhancement

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61293657A (en) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd Method for inspecting soldering appearance
WO2006128317A1 (en) * 2005-06-03 2006-12-07 Elpatronic Ag Method for illumination, and illumination arrangement
WO2009094489A1 (en) * 2008-01-23 2009-07-30 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
US20100326962A1 (en) * 2009-06-24 2010-12-30 General Electric Company Welding control system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4863268A (en) * 1984-02-14 1989-09-05 Diffracto Ltd. Diffractosight improvements
US5978090A (en) * 1996-10-10 1999-11-02 Elpatronic Ag Method and arrangement for optical inspection of a weld seam
US6204469B1 (en) * 1999-03-04 2001-03-20 Honda Giken Kogyo Kabushiki Kaisha Laser welding system
WO2001096839A1 (en) * 2000-06-14 2001-12-20 Teradyne, Inc. Optical inspection system
WO2006048500A1 (en) * 2004-11-03 2006-05-11 Valtion Teknillinen Tutkimuskeskus Laser welding method
US20090281753A1 (en) * 2008-03-31 2009-11-12 Noam Noy method and system for photovoltaic cell production yield enhancement

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2684033A4 *

Also Published As

Publication number Publication date
WO2012120192A2 (en) 2012-09-13
EP2684033A2 (en) 2014-01-15
FI20115241A0 (en) 2011-03-10
EP2684033A4 (en) 2014-10-01

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