A method for entering test mode of an integrated circuit device is disclosed. In one embodiment of the present invention, after a lockout period, a test controller generates a signal indicating the integrated circuit is willing to enter the test mode. After the signal, the test controller monitors a...http://www.google.es/patents/US6823282?utm_source=gb-gplus-sharePatente US6823282 - Test architecture for microcontroller providing for a serial communication interface
Test architecture for microcontroller providing for a serial communication ...
