A probe board provides signal paths between an integrated circuit (IC) tester and probes accessing terminals on the surfaces of ICs formed on a semiconductor wafer for receiving test signals form the IC tester. A branching signal path within the probe board distributes a test signal produced by one channel...http://www.google.es/patents/US7012442?utm_source=gb-gplus-sharePatente US7012442 - Test signal distribution system for IC tester
