A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the...http://www.google.es/patents/US6492802?utm_source=gb-gplus-sharePatente US6492802 - Apparatus and method for detecting defects in a multi-channel scan driver
Apparatus and method for detecting defects in a multi-channel scan driver
