A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination...http://www.google.es/patents/US7576850?utm_source=gb-gplus-sharePatente US7576850 - In-process vision detection of flaws and FOD by back field illumination
In-process vision detection of flaws and FOD by back field illumination
