A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus. ...http://www.google.es/patents/US20060072645?utm_source=gb-gplus-sharePatente US20060072645 - Thermometry probe calibration method
Número de solicitud: 11/248,492 Número de publicación: US 2006/0072645 A1 Fecha de presentación: 12 Oct 2005 Patente emitida: US7255475 ( Fecha de emisión 14 Ago 2007)
