A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones...http://www.google.es/patents/US8067951?utm_source=gb-gplus-sharePatente US8067951 - Method of expanding tester drive and measurement capability
Method of expanding tester drive and measurement capability
