A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected...http://www.google.es/patents/US20020079911?utm_source=gb-gplus-sharePatente US20020079911 - Probe holder for low current measurements
Número de solicitud: 10/086,331 Número de publicación: US 2002/0079911 A1 Fecha de presentación: 1 Mar 2002 Patente emitida: US6496024 ( Fecha de emisión 17 Dic 2002)
