Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals...http://www.google.es/patents/US6947802?utm_source=gb-gplus-sharePatente US6947802 - Centralized control architecture for a laser materials processing system
Centralized control architecture for a laser materials processing system
