In an embodiment, an integrated circuit or chip is supplied to its intended application and a measurement quantity representing the state of one or a plurality of electrical connections in the chip is determined within the application environment of the chip and, if the measurement quantity determined...http://www.google.es/patents/US7684949?utm_source=gb-gplus-sharePatente US7684949 - Apparatus and method for determining reliability of an integrated circuit
Apparatus and method for determining reliability of an integrated circuit
