A system for testing integrated circuits is disclosed which uses a mechanical microprobe and the integrated circuit's CAD database. The system is integrated with the CAD database in such a manner that after an initial alignment operation between the CAD database and the integrated circuit being tested,...http://www.google.es/patents/US5030907?utm_source=gb-gplus-sharePatente US5030907 - CAD driven microprobe integrated circuit tester
