Phase delay, amplitude and the like of sinusoidal strain (stress) are detected with high precision, and also adverse influences caused by expansion, shrinkage, stress relaxation, and creep of a sample are removed by a simple correction term by way of a mathematical method, utilizing Fourier transformation...http://www.google.es/patents/US5452614?utm_source=gb-gplus-sharePatente US5452614 - Dynamic viscoelasticity apparatus
