A Dynamic Laser Speckle Profilometer (DLSP) apparatus and method are provided to preform nondestructive analysis of materials, components, and assemblies by creating an optoelectronic phase map. This phase map is used to generate the deformation and resonance mode mapping of an object under test. The...http://www.google.es/patents/US5020904?utm_source=gb-gplus-sharePatente US5020904 - Dynamic laser speckle profilometer and method
