Disclosed is a multiple measurement multiple energy X-ray imaging system in which a plurality of measurements are processed to provide a first image signal representing a desired parameter of an object and in which the plurality of measurements are processed to provide a second processed image signal...http://www.google.es/patents/US4499493?utm_source=gb-gplus-sharePatente US4499493 - Multiple measurement noise reducing system using artifact edge identification and selective signal processing
Multiple measurement noise reducing system using artifact edge ...
