The invention provides a semiconductor device capable of appropriately debugging any fluctuation in element characteristic even when the element characteristic fluctuates exceeding a value estimated at the designing stage. This semiconductor device includes a process monitor circuit that monitors any...http://www.google.es/patents/US6853177?utm_source=gb-gplus-sharePatente US6853177 - Semiconductor device with process monitor circuit and test method thereof
Semiconductor device with process monitor circuit and test method thereof
