A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor configured to detect electromagnetic...http://www.google.es/patents/US7280227?utm_source=gb-gplus-sharePatente US7280227 - Device, method and system for measuring the distribution of selected properties in a material
Device, method and system for measuring the distribution of selected ...
