A semiconductor device is tested for its function by sandwiching the inventive anisotropic conductive film 1 between a semiconductor device 2 and a circuit board 3, and applying a contact load F of 3-50 gf per one electrode of the device to achieve functionally testable conduction between the device...http://www.google.es/patents/US6597192?utm_source=gb-gplus-sharePatente US6597192 - Test method of semiconductor device
