A fast high-density data compression circuit adapted to semiconductor integrated circuits of the memory type including an ABIST unit. This circuit, which compares the data-out signals output by the memory unit with the expected data generated by the ABIST unit to deliver a signal on a cycle by cycle...http://www.google.es/patents/US5442641?utm_source=gb-gplus-sharePatente US5442641 - Fast data compression circuit for semiconductor memory chips including an array built-in self-test structure
Fast data compression circuit for semiconductor memory chips including an ...
