Flourescence spectrophotometer for measuring fluorescent light of a ...

[54] FLOURESCENCE SPECTROPHOTOMETER FOR MEASURING FLUORESCENT LIGHT OF A PLURALITY OF WAVELENGTH CONDITIONS

[75] Inventor: Kunihiko Ohkubo, Moriyama, Japan

[73] Assignee: Sbimadzu Corporation, Japan

[21] Appl. No.: 298,969

[22] Filed: Jan. 19,1989

[30] Foreign Application Priority Data

Feb. 16, 1988 [JP] Japan 63-34735

[51] Int. CI.* G01N 21/64

[52] U.S. CI 356/318; 250/458.1;

250/459.1

[58] Field of Search 356/317, 318;

250/458.1, 459.1, 461.1, 461.2

[56] References Cited

U.S. PATENT DOCUMENTS

4,299,486 11/1981 Nogami et al 356/318

4,795,256 1/1989 Krause et al 356/318 X

In a fluorescence spectrophotometer comprising a light source, an excitation monochromator, a sample cell, an emission monochromator, a photodetector and a signal processing device, an excitation light polarizer and an emission light polarizer are disposed in the excitation light path and the emission light path, respectively, and the excitation and emission light wavelengths of the two monochromators are changed simultaneously in accordance with each of a plurality of wavelength conditions, and in each of the wavelength conditions, the direction of polarization of the emission light polarizer is changed between two orthogonal directions, in each of which the output of the detector is sampled by the signal processor, and the processed data is stored so as to be used for calculation of the degree of polarization of the polarized fluorescent light from the sample.

12 Claims, 4 Drawing Sheets