Page 2 U.S. PATENT DOCUMENTS EP 0 738 012 10/1996 JP 56-111258 9/1981 4,851,363 A 7/1989 Troxell et al. jp 60_127761 7/1935 5,170,244 A 12/1992 Dohjo et al. jp 3_020046 1/1991 5,217,910 A 6/1993 Shimizu et al. jp 3_095933 4/1991 5,247,190 A 9/1993 Friend et al. jp 3_095939 4/1991 5,292,675 A 3/1994 Codama jp 04_253160 9/1992 5,306,651 A 4/1994 Masumo et al. jp 04_369271 12/1992 5,323,042 A 6/1994 Matsumoto jp 05_102433 4/1993 5,399,502 A 3/1995 Friend et al. jp 06_143635 5/1994 5,401,982 A 3/1995 King et al. jp 6_291314 10/1994 5,413,945 A 5/1995 Chien et al. jp 07_130652 5/1995 5,528,397 A 6/1996 Zavracky et al. jp 07_235630 9/1995 5,532,176 A 7/1996 Katada et al. jp 03_073329 3/1996 5,563,427 A 10/1996 Yudasaka et al. jp 03_116065 5/1996 5,583,369 A 12/1996 Yamazaki et al. jp 03_264734 10/1996 5,594,569 A 1/1997 Konuma et al. jp 03_274336 10/1996 5,643,826 A 7/1997 Ohtani et al. jp 09_191111 7/1997 5,686,328 A 11/1997 Zhang et al. jp 09_293600 11/1997 5,705,424 A 1/1998 Zavracky et al. jp 10_065131 3/1993 5,736,750 A 4/1998 Yamazaki et al. jp 10_092576 4/1993 5,764,206 A 6/1998 Koyama et al. jp 10_104659 4/1993 5,786,241 A 7/1998 Shimada jp 10_135463 5/1993 5,830,787 A 11/1998 Kim jp 10_135469 5/1993 5,923,962 A 7/1999 Ohtani et al. jp 10_233511 9/1993 5,949,107 A 9/ 1999 Zhang JP 10-294280 11/1998 5,953,582 A * 9/1999 Yudasaka et al. ............ .. 438/29 jp 11_191623 7/1999 6,001,714 A 12/1999 Nakajima et al. jp 11_345767 12/1999 6,030,667 A 2/2000 Nakagawa et al. jp 11_354442 12/1999 6,087,679 A 7/2000 Yamazaki et al. jp 2000_216399 3/2000 6,096,585 A 8/2000 Fukuda et al. jp 2000_299469 10/2000 6,114,715 A 9/200° Hmada KR 2000-0013704 3/2000 6,133,074 A 10/2000 Ishida et al. W0 W0 90/13143 11/1990 6,140,667 A * 10/2000 Yamazaki et al. ........... .. 257/59 6,166,414 A 12/2000 Miyazaki et al. 6,198,133 B1 * 3/2001 Yamazaki et al. ......... .. 257/347 OTHER PUBLICATIONS 6,222,238 B1 4/2001 Chang et ab R. Shimokawa et al., Characterization of High-Eficiency Cast-Si 6,278,131 B1 8/2001 Yamazakl et a1~ Solar Cell Wafers by MBIC Measurement, Japanese Journal of 6,281,552 B1 8/2001 K=1W=1S_=11<i <->H11~ Applied Physics, vol. 27, No. 5, May 1, 1988, pp. 751-758. 215383351 13/5331 31325512, ¥2§";§?f2,°§,§-§,‘,"252251ffZ;,‘Z’%'Z,?,$;‘Z,Z’,I"féi§”§f€€P€,f,ii€;§i 122514 %1:lP4u41Z1:1;a‘; 41 <6)f International Electron Devices Meeting, Dec. 7, 1997, pp. }:)nl:;Z:‘tk;18t 31' Schenk it al., Polymers for Light Emitting Diodes, EuroDisplay 634203758 Bl 7/2002 Nakajima 19999,9The 1393 3Ii7iternat1ona1 Display Research Conference, Sep. 6-9, 6’507’069 Bl 1/2003 Zhang et a1‘ S. Inuiapet al. Thresholdless Antiferroelectricity in Liquid Crystals 6’54l’294 Bl 4/2003 Yamazaki et 31' and itsApplication to Displays, J. Mater. Chem., vol. 6, No. 4, Jan. 1, 6,590,230 B1 7/2003 Yamazaki et al. 1996 pp‘ 671673‘ 6,599,785 B2 7/2003 Hamada et al. ’ . . . B1 e 6,664,145 B1 12/2003 Yamazaki et al. 199941)‘ 1316‘ ’ ' ’ ' ’ 6’773’97l Bl 8/2004 Zhang et T. Yoshida et al., 33.2." A Full-Color Thresholdless Antiferroelectric 6’777’7l6 Bl 8/2004 Yamazakl eta1' LCD Exhibiting Wide J/iewing Angle with Fast Response Time SID 6’803’60l B2 10/2004 Nakajima 97 Di est‘ SID International S osium Di est of Technical Pa ers 6,906,383 Bl 6/2005 Zhang et 51. Jan £51937 8414444 YIPP "5 P ’ 6,972,435 B2 12/2005 Ohtani H ‘F ’ P’_17’§j Ch 7' . Z. 4 D . . S 4 P I _ 7,202,499 B2 4/2007 Nakajima . urue, . arac eris ics an I I riving c eme of oymer 7 301 209 B2 11/2007 Takemura et 41‘ Stabilized Monostable FLCD Exhibiting Fast Response Time and ’ ’ - High ContrastRatio with Gray-Scale Capability, SID 98 Digest: SID 2002/0134983 A1 9/2002 Yamazaki . . . . 2005/0007494 Al 1/2005 Yamazaki et 41‘ International Symposium Digest of Technical Papers, Jan. 1, 1998, 2005/0104068 Al 5/2005 Yamazaki PP" 782785"
Office Action (Korean Patent Application No. 10-2007-0020342)
Dated Oct. 21, 2008.