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US005729503A

United States Patent [19] [ii] Patent Number: 5,729,503

Manning [45] Date of Patent: Mar. 17, 1998 Page 2

[54] ADDRESS TRANSITION DETECTION ON A SYNCHRONOUS DESIGN

[75] Inventor: Troy A. Manning, Boise, Id

[73] Assignee: Micron Technology, Inc.. Boise, Id.

[21] Appl. No.: 506,438
[22] Filed: Jul. 24,1995

Related U.S. Application Data

[63] Continuation-in-part of Set. No. 386,894, Feb. 10,1995, Pat No. 5,610,864, which is a continuation-in-part of Ser. No. 370,761, Dec. 23, 1994, Pat. No. 5,526,320.

[51] Int. CI.6 GUC 8/00

[52] U.S. CI 365/233.5; 365/189.05;

365/202; 365/230.08

[58] Field of Search 365/233.5,230.08,

365/189.05, 202

[56] References Cited

U.S. PATENT DOCUMENTS

4,344,156 8/1982 Eaton, Jr. et al 365/203

4,355,377 10/1982 Sud et al 365/203

4,484,308 11/1984 Lewandowski et al 364/900

4,562,555 12/1985 Chichi et al 365/233

(List continued on next page.)

FOREIGN PATENT DOCUMENTS

19507562 9/1995 Germany.

OTHER PUBLICATIONS

"DRAM 1 Megx4 DRAM 5VEDO Page Mode", 1995 DRAM Data Book, pp. 1-1 thru 1-30, (Micron Technology, D

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An integrated circuit memory device is designed to perform high speed burst access read and write cycles. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. A transition of the Read/Write control line during a burst access is used to terminate the burst access and initialize the device for another burst access. The memory device maintains compatibility with nonburst mode devices such as Extended Data Out (EDO) and Fast Page Mode through bond option or mode selection circuitry. A multiplexer selects between the input address and the burst address generator output to feed an asynchronous address transition detection circuit The address transition detection circuit generates an equilibration control signal between memory access cycles.

8 Claims, 7 Drawing Sheets

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U.S. PATENT DOCUMENTS

4,567,579 1/1986 Patd et al 365/189

4,575,825 3/1986 Ozaki et al 365/189

4,603,403 7/1986 Toda 365/189

4,618,947 10/1986 Iranetal 365/230

4,649,522 3/1987 Kitsch 365/189

4,685,089 8/1987 Patel et al 365/233

4,707,811 11/1987 Takemaeetal 365/239

4,788,667 11/1988 Nakano et al 365/193

4,870,622 9/1989 Aria et al 365/230.02

4,875,192 10/1989 Matsumoto 365/193

5,058,066 10/1991 Yu 365/189.05

5,126,975 6/1992 Handy et al 365/230.01

5,267,200 11/1993 Tobita 365/189.05

5,268,865 12/1993 Takasngi 365/189.05

5,280,594 1/1994 Young et al 395/425

5,305,284 4/1994 Iwase 365/238.5

5,325,330 6/1994 Morgan 365/189.05

5,325,502 6/1994 McLaury 395/425

5,349,566 9/1994 Merritt et al 365/233.5

5,357,469 10/1994 Sommeretal 365/193

5,373,227 12/1994 Keeth 323/313

5^79^61 1/1995 Jones, Jr. 365/230.01

5,392,239 2/1995 Margulis et al 365/189.01

5,410,670 4/1995 Hansen et al 395/425

5,452,261 9/1995 Chung et al 365/233

5,457,659 10/1995 Schaefer 365/222

5426,320 6/1996 Zagaretal 365/2334

5498,376 1/1997 Merritt et al 365/230.06

5,610,864 3/1997 Manning 365/189.05 X

5,640364 6/1997 Merritt et al 365/233.5

5,652,724 7/1997 Manning 365/233 X

5,661,695 8/1997 Zagaretal 365/233.5

5,668,773 9/1997 Zagaretal 365/233

OTHER PUBLICATIONS

"Application Specific DRAM", Toshiba America Electronic

Components, Inc., C178, C-260, C 218, (1994).

"Burst DRAM Function & Pinout", Oki Electric Ind, Co.,

Ltd., 2nd Presentation, Item # 619, (Sep. 1994).

"Hyper Page Mode DRAM", 8026 Electronic Engineering,

66, No. 813, Woolwich, London, GB, pp. 47-48, (Sep.

1994).

"Mosel-Vitelic V53C8257H DRAM Specification Sheet, 20 pages, Jul. 2, 1994".

"Pipelined Burst DRAM", Toshiba, JEDEC JC 42.3 Hawaii, (Dec. 1994).

"Samsung Synchronous DRAM", Samsung Electronics, pp. 1-16, (Mar. 1993).

"Synchronous DRAM 2 MEGx8 SDRAM", Micron Semiconductor, Inc., pp. 2-43 through 2-8. Dave Bursky, "Novel I/O Options and Innovative Architectures Let DRAMs Achieve SRAM Performance; Fast DRAMS can be swapped for SRAM Caches", Electronic Design, vol. 41, No. 15, Cleveland, Ohio, pp. 55-67, (Jul. 22, 1993).

Shiva P. Gowni, et al., "A 9NS, 32Kx9. BICMOS TTL Synchronous Cache RAM With Burst Mode Access", IEEE Custom Integrated Circuits Conference, pp. 781-786, (Mar. 3, 1992).

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