(12) United States Patent ao) Patent No.: us 6,559,655 Bi
Rosenthal et al. (45) Date of Patent: May 6,2003
Page 2
(54) SYSTEM AND METHOD FOR ANALYZING AGRICULTURAL PRODUCTS ON HARVESTING EQUIPMENT
(75) Inventors: Todd C. Rosenthal, Hagerstown, MD
(US); Stuart W. Wrenn, Frederick, MD
(US)
(73) Assignee: Zeltex, Inc., Hagerstown, MD (US)
( * ) Notice: Subject to any disclaimer, the term ol this patent is extended or adjusted under 35 U.S.C. 154(b) by 0 days.
(21) Appl. No.: 09/844,698
(22) Filed: Apr. 30, 2001
(51) Int. C I. G01J 3/28
(52) U.S. CI 324/634; 250/252
(58) Field of Search 460/7, 149; 356/328;
324/634, 640, 644, 689; 250/252, 252.2, 339.12, 343, 349, 553
(56) References Cited
U.S. PATENT DOCUMENTS
4,095,105 A 6/1978 Rosenthal 360/74.2
4,286,327 A 8/1981 Rosenthal et al 702/23
4,379,233 A 4/1983 Rosenthal 250/553
4,404,642 A 9/1983 Rosenthal 702/85
4,466,076 A 8/1984 Rosenthal 702/85
4,480,706 A 11/1984 Rosenthal 177/50
4,487,278 A 12/1984 Rosenthal 177/25.12
4,627,008 A 12/1986 Rosenthal 702/23
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(List continued on next page.)
OTHER PUBLICATIONS
"Zeltex ZX-50, Portable, Battery-Operated: Near Infrared
Whole Grain Analyzer", Brochure, 4 pages, 1997.
"Zeltex ZX-101B/C, Portable Octane Analyzer", Brochure,
2 pages, 1993.
"Zeltex ZX-550, Near Infrared Portable Food/Cheese Ana-
lyzer", Brochure, 4 pages, May 2000.
Swedish Institute ol Agriculture and Environmental Engi-
neering, Annual Report, 1 page, May 2000.
Primary Examiner—N. Le
Assistant Examiner—-Vincent Q Nguyen
(74) Attorney, Agent, or Firm—Rothwell, Figg, Ernst &
Manbeck
(57) ABSTRACT
A system for analyzing agricultural products on harvesting equipment includes a test chamber and a near infrared spectrometer disposed within a housing capable ol being mounted on the harvesting equipment. A source ol near infrared radiation is disposed in the housing adjacent the test chamber so as to emit near infrared radiation into the test chamber, and a near infrared detector is disposed in the housing adjacent the test chamber so as to receive near infrared radiation exiting the test chamber. The spectrometer is mounted on vibration damping elements. A computer controls operation ol first and second doors for controlling ingress and egress ol product samples from the test chamber and can also be used to process signals from the spectrometer.
31 Claims, 9 Drawing Sheets