An electric field measuring apparatus for causing an optical probe head having an electro-optic member with an electro-optic material to oppose a sample such as a semiconductor integrated circuit device and for optically measuring a voltage of an opposite portion of the sample. The electro-optic material...http://www.google.es/patents/US5592101?utm_source=gb-gplus-sharePatente US5592101 - Electro-optic apparatus for measuring an electric field of a sample
Electro-optic apparatus for measuring an electric field of a sample
